PRODUCTS
TEST CORE
TEST CORE
High-Performance DC~67GHz Interconnections for Space-Constrained Test Environments
TEST CORE: Extra-Thin Cable Assemblies for High-Density Test Configurations
Covering DC~67GHz, the TEST CORE series delivers reliable electrical performance in the industry's thinnest form factor. Engineered for space-constrained environments—including multi-port ATE systems, high-density RF fixtures, and harness assemblies—these cable assemblies maintain Phase Micro Lite-level electrical performance without additional protective layers, enabling maximum routing flexibility in compact test setups.
Key Applications
Multi-Port ATE Systems
Automated test equipment requiring simultaneous multi-channel measurements in compact configurations. Ultra-thin profile enables high-density channel routing without signal crosstalk or mechanical interference.
High-Density RF Fixtures
Test fixtures with limited internal space and multiple RF connection points. Minimal cable diameter reduces bending radius requirements, simplifying complex routing paths in constrained layouts.
Harness Assembly Integration
Embedded cable assemblies within equipment harnesses and interconnect systems. Streamlined construction integrates seamlessly into existing cable bundles without adding bulk or weight.
Onboard Instrumentation
Internal equipment connections and instrument-to-device interconnects where space is at a premium. Compact form factor enables routing through tight cable management channels and bulkhead feedthroughs.
Power Handling
Power Versatility
Designed for varied power levels across diverse test scenarios:
- Low to medium power applications
- Suitable for component-level testing and signal analysis
- Compact design optimized for signal integrity over maximum power
- Low to medium power applications
- Suitable for component-level testing and signal analysis
- Compact design optimized for signal integrity over maximum power
Attenuation
Minimal Signal Loss
Designed for varied power levels across diverse test scenarios:
- Low to medium power applications
- Suitable for component-level testing and signal analysis
- Compact design optimized for signal integrity over maximum power
- Low to medium power applications
- Suitable for component-level testing and signal analysis
- Compact design optimized for signal integrity over maximum power
Phase Change and Stability
Phase Stability Performance:
- E14 series: ±3° phase stability across frequency range
- E10 series: ±6° phase stability
- Consistent performance under mechanical stress and flexure
TEST CORE assemblies maintain reliable phase measurements in applications requiring compact routing and repeated flex cycles. Suitable for semiconductor testing, phase array radar systems, and VNA measurements where space constraints cannot compromise electrical performance.
- E10 series: ±6° phase stability
- Consistent performance under mechanical stress and flexure
TEST CORE assemblies maintain reliable phase measurements in applications requiring compact routing and repeated flex cycles. Suitable for semiconductor testing, phase array radar systems, and VNA measurements where space constraints cannot compromise electrical performance.
Technical Data Specifications - Test Core
| Product | Max Frequency | Minimum Insertion Loss | Phase Stability vs Flexure | Jacket O.D. | Download |
|---|---|---|---|---|---|
| LH14 | 8.5GHz | -1.3dB /meter | ±2° | ø5mm | Download |
| LH18 | 8.5GHz | -1.1dB meter | ±2° | ø6mm | Download |
| E50 | 6GHz | -0.2dB /meter | - | ø12mm | Download |
| LH31 | 12.5GHz | - 5.0 dB /meter | ±2° | ø9mm | Download |
| E31 | 18GHz | - 0.64dB / meter | ±2° | ø8mm | Download |
| E20 | 26.5GHz | -1.4dB / meter | ±2° | ø4.8mm | Download |
| E14 | 43.5GHz | -2.6dB / meter | ±4° | ø3.8mm | Download |
| E13 | 50GHz | -3.4dB / meter | ±4° | ø3.2mm | Download |
| E10 | 67GHz | -5.7dB / meter | ±8° | ø2.3mm | Download |